PCB Component Recognition With Semi-Supervised Image Clustering

dc.contributor.author Unal, Ahmet Emin
dc.contributor.author Tasdemir, Kasim
dc.contributor.author Bahcebasi, Akif
dc.date.accessioned 2025-09-25T10:54:22Z
dc.date.available 2025-09-25T10:54:22Z
dc.date.issued 2021
dc.description Tasdemir, Kasim/0000-0003-4542-2728 en_US
dc.description.abstract Classification of surface mounted devices plays an important role on automated inspection systems of printed component board production. Limited number of publicly available datasets which the components are labeled and high intraclass variance in these datasets causes the supervised approches to be inefficient. In this study a deep learning method, enhanced with an unsupervised clustering system, which uses a small set of labeled data is proposed. The method compared with the current studies and the supervised systems. Most optimized setting reached high accuracy results by outrunning current classification methods. en_US
dc.identifier.doi 10.1109/SIU53274.2021.9477791
dc.identifier.isbn 9781665436496
dc.identifier.scopus 2-s2.0-85111414546
dc.identifier.uri https://doi.org/10.1109/SIU53274.2021.9477791
dc.identifier.uri https://hdl.handle.net/20.500.12573/4369
dc.language.iso tr en_US
dc.publisher IEEE en_US
dc.relation.ispartof 29th IEEE Conference on Signal Processing and Communications Applications (SIU) -- JUN 09-11, 2021 -- ELECTR NETWORK en_US
dc.rights info:eu-repo/semantics/closedAccess en_US
dc.subject Semi-Supervised Image Clustering en_US
dc.subject Deep Learning en_US
dc.subject Printed Circuit Board en_US
dc.subject Surface-Mount Device en_US
dc.subject Automated Vision Inspection System en_US
dc.title PCB Component Recognition With Semi-Supervised Image Clustering en_US
dc.type Conference Object en_US
dspace.entity.type Publication
gdc.author.id Tasdemir, Kasim/0000-0003-4542-2728
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gdc.author.wosid Tasdemir, Kasim/Aga-4286-2022
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gdc.description.department Abdullah Gül University en_US
gdc.description.departmenttemp [Unal, Ahmet Emin; Tasdemir, Kasim; Bahcebasi, Akif] Abdullah Gul Univ, Bilgisayar Muhendisligi, Kayseri, Turkey en_US
gdc.description.endpage 4
gdc.description.publicationcategory Konferans Öğesi - Uluslararası - Kurum Öğretim Elemanı en_US
gdc.description.scopusquality N/A
gdc.description.startpage 1
gdc.description.woscitationindex Conference Proceedings Citation Index - Science
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