WoS İndeksli Yayınlar Koleksiyonu

Permanent URI for this collectionhttps://hdl.handle.net/20.500.12573/394

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Author: search.filters.author.Kurban, RifatPublisher: search.filters.publisher.IEEE

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  • Conference Object
    Citation - WoS: 2
    Citation - Scopus: 2
    Fine Tuning DeepSeek and Llama Large Language Models with LoRA
    (IEEE, 2025-06-25) Uluirmak, Bugra Alperen; Kurban, Rifat
    In this paper, Low-Rank Adaptation (LoRA) finetuning of two different large language models (DeepSeek R1 Distill 8B and Llama3.1 8B) was performed using the Turkish dataset. Training was performed on Google Colab using A100 40 GB GPU, while the testing phase was carried out on Runpod using L4 24 GB GPU. The 64.6 thousand row dataset was transformed into question-answer pairs from the fields of agriculture, education, law and sustainability. In the testing phase, 40 test questions were asked for each model via Ollama web UI and the results were supported with graphs and detailed tables. It was observed that the performance of the existing language models improved with the fine-tuning method.
  • Conference Object
    Citation - Scopus: 1
    A Comprehensive Investigation into Strip Steel Defect Detection Using Traditional Machine Learning and Deep Learning Models
    (IEEE, 2025-05-23) Erkantarci, Betul; Kurban, Rifat; Bakal, Mehmet Gokhan; Kose, Abdulkadir
    The steel manufacturing sector places great importance on guaranteeing the quality of strip steel products, which has led to a thorough investigation of defect detection approaches. This work conducts a comparative analysis of traditional machine learning and deep learning models to determine their efficacy in detecting defects in strip steel. Our analysis is based on a dataset that includes a variety of images of strip steel surfaces showing different types of defects. In this work, we adopt image preprocessing techniques to improve the quality of input images prior to the application of classification methods. We employ traditional ML algorithms including Support Vector Machine and Random Forest, and deep learning model AlexNet Convolutional Neural Networks for effective defect classification. Consequently, we present comparative evaluations that highlight the strengths and weaknesses of each approach, considering accuracy scores.